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Mircea Modreanu - Staff Researcher

researcher

Contact

+353 (0)21 2346267
mircea.modreanu (at) tyndall (dot) ie

  • MNS (Materials and Devices)
EDUCATION: 1993 - Master of Science degree in Atomic and Molecular Physics from Faculty of Physics, University of Bucharest. 2001 –Ph.D.degree in Condensed Physics Matter (Magna cum Laude), from University of Bucharest. The thesis is dedicated to the theoretical and experimental study of deposition kinetics, optical,electrical and structural properties of amorphous and crystalline silicon, silicon nitride, silicon oxynitride and silicon-rich nitride and doped and undoped SiO2 CVD thin films.   POSITIONS HELD  : 2006-             Tyndall National Institute , Cork, Ireland, Staff Research Scientist, Optical Spectroscopy Laboratory  Manager 2002-2006       National Microelectronics Research Centre, Cork, Ireland, Post Doctoral Fellow 1999-2001       National Institute for R&D for Microtechnologies, Bucharest, Romania: Senior Researcher: research, development and characterization of CVD thin films for semiconductors and MOEMS technologies 1995- 1999    National Institute for R&D for Microtechnologies, Bucharest, Romania: Process Engineer: APCVD&LPCVD process sustaining and development for MOS and microsensors technologies 1993- 1995    National Institute for R&D for Microtechnologies, Bucharest, Romania: Process Engineer: APCVD process sustaining and development for MOS technologies. EXPERIENCE : Dr. Mircea Modreanu has obtained a Ph.D. in Condensed Matter Physics in 2002 from the University of Bucharest, Romania. He has received Research Professor Fellowships from PHELMA-INPG Grenoble, France (2013-2014) and recently (2019) from the Japan Society for Promotion of Science (JSPS).  Dr. Mircea Modreanu joined Tyndall National Institute-University College Cork Ireland in 2002 where he is Principal Investigator working in several EU-funded research projects.  Dr. Mircea Modreanu currently is Project Coordinator for the H2020 EIC FET Proactive project Nanomaterials enabling smart energy harvesting for next-generation Internet-of-Things (NANO-EH, Grant No 951761, 2020-2023) and also Principal Investigator in two other EU H2020 projects, namely FET Open PHEMTRONICS (2020-2023) and ICT NANOSMART (2019-2022).Dr. Mircea Modreanu has over 25 years of track record in material science (with a particular focus on oxide materials), in developing novel materials for microelectronics and optoelectronics application, and in optical spectroscopies for thin films and interfaces. He has established expertise within the area of optical spectroscopies (spectroscopic ellipsometry, optical spectrophotometry, and Raman and IR spectroscopies) for the studies of thin films and their interfaces. He has extensively researched the growth of HfO2 and ferroelectric HfZrO by several growth techniques ( e.g. E-beam, MOCVD, and ALD) for future CMOS technologies. He has also explored other metal oxides for microelectronics and optoelectronics applications (e.g. ZrO2, La2O6, Lu2O6, Ta2O5, Ba-doped SrCu2O2, Sr-doped Cu2O, ZnO, TiO2, BaCu2O2 and Gd2O3) and as well emerging two-dimensional materials such as graphene, MoS2, HfS2, and PtS2. In a recently funded H2020 FET Open project, PHEMTRONICS Dr. Mircea Modreanu's research interest was extended to novel phase-change materials such as GaS, GeS and Sb2S3 for ultrafast optoelectronic applications.Dr. Mircea Modrean

Functional metal oxides:
-dielectrics (high k materials, tunable refractive index materials)
-semiconductors (n-type TCOs, p-type TCOs)
-metal oxides for gas sensing application
2D materials:
-graphene
-graphene oxide
-MoS2
-black phosphorus
Advanced optical spectroscopy of thin films and their interfaces:
-amorphous to crystalline phase transition
-interfacial properties
-optical properties ( UV down to Far IR spectral range)
-vibrational properties (IR and Raman)
-spectroscopic ellipsometry
-optical spectrophotometry
-surface and tip enhanced IR and Raman spectrocopy
 Transparent electronics
Virtual substrates for novel optoelectronic devices and for high efficiency solar cells
Integration of III-V materials on Si

Research Grants

Funder Start Date End Date Title Role
European Framework Programme Seven (FP7) 03-SEP-12 08-SEP-15 Carbon Based Smart Systems For wireless applications.

Research Collaborators

Company Country Name
INSA Rennes FRANCE Prof. Olivier Durand
Thales R&T FRANCE Dr. Afshin Ziaei
Thales R&T FRANCE Dr. Guy Garry
INPG-LMGP FRANCE Dr. Carmen Jimenez
Thales R&T FRANCE Dr. Bernard Servet
Institul de Chimie Fizica I.G.Murgulescu al Academiei Romane ROMANIA Dr Mariuca Gartner
Oak Ridge National Laboratory U.S.A. Dr. G.E.Jellison
University of Versailles FRANCE Prof. Yves Dumont

Other Journals

YearJournalPublication
2014Applied Surface ScienceEffect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films
Gartner, M. and Stroescu, H. and Marin, A. and Osiceanu, P. and Anastasescu, M. and Stoica, M. and Nicolescu, M. and Duta, M. and Preda, S. and Aperathitis, E. and Pantazis, A. and Kampylafka, V. and Modreanu, M. and Zaharescu, M. (2014) Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films. : .
2014Journal of Biomaterials ApplicationsCarboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications
Ormsby, R.W. and Modreanu, M. and Mitchell, C.A. and Dunne, N.J. (2014) Carboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications. : .
2013Scripta MaterialiaStructural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires
Rossi, F. and Fabbri, F. and Tallarida, M. and Schmeisser, D. and Modreanu, M. and Attolini, G. and Salviati, G. (2013) Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires. : .
2013Thin Solid FilmsInfluence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films
Stroescu, H. and Anastasescu, M. and Preda, S. and Nicolescu, M. and Stoica, M. and Stefan, N. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. and Zaharescu, M. and Gartner, M. (2013) Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films. : .
2013Journal of Applied PhysicsElectron scattering mechanisms in fluorine-doped SnO2 thin films
Rey, G. and Ternon, C. and Modreanu, M. and Mescot, X. and Consonni, V. and Bellet, D. (2013) Electron scattering mechanisms in fluorine-doped SnO2 thin films. : .
2013Thin Solid FilmsVibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements
Even, J. and Pedesseau, L. and Durand, O. and Modreanu, M. and Huyberechts, G. and Servet, B. and Chaix-Pluchery, O. (2013) Vibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements. : .
2013Thin Solid FilmsSpecial issue on "current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012
Modreanu, M. and Durand, O. and Jellison, G.E. and Salviati, G. and Fried, M. (2013) Special issue on "current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012. : .
2012Solid-State ElectronicsOptimisation and scaling of interfacial GeO 2 layers for high-κ gate stacks on germanium and extraction of dielectric constant of GeO 2
Murad, S.N.A. and Baine, P.T. and McNeill, D.W. and Mitchell, S.J.N. and Armstrong, B.M. and Modreanu, M. and Hughes, G. and Chellappan, R.K. (2012) Optimisation and scaling of interfacial GeO 2 layers for high-κ gate stacks on germanium and extraction of dielectric constant of GeO 2. : .
2012Applied Surface ScienceInfluence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing
Nicolescu, M. and Anastasescu, M. and Preda, S. and Stroescu, H. and Stoica, M. and Teodorescu, V.S. and Aperathitis, E. and Kampylafka, V. and Modreanu, M. and Zaharescu, M. and Gartner, M. (2012) Influence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing. : .
2011Thin Solid FilmsTransparent p/n diode device from a single zinc nitride sputtering target
Kambilafka, V. and Kostopoulos, A. and Androulidaki, M. and Tsagaraki, K. and Modreanu, M. and Aperathitis, E. (2011) Transparent p/n diode device from a single zinc nitride sputtering target. : .
2011AnalystRaman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells
McManus, L.L. and Burke, G.A. and McCafferty, M.M. and O'Hare, P. and Modreanu, M. and Boyd, A.R. and Meenan, B.J. (2011) Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells. : .
2011Microelectronic EngineeringInvestigation of bulk defects in amorphous and crystalline HfO< sub> 2 thin films
Modreanu, M and Monaghan, S and Povey, IM and Cherkaoui, K and Hurley, PK and Androulidaki, M (2011) Investigation of bulk defects in amorphous and crystalline HfO< sub> 2 thin films. : .
2010Journal of Optoelectronics and Advanced MaterialsInvestigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate
Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Osiceanu, P. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. (2010) Investigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate. : .
2010Journal of Optoelectronics and Advanced MaterialsSurface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates
Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Stroescu, H. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. (2010) Surface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates. : .
2010Physica Status Solidi (A) Applications and Materials ScienceProperties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures
Louloudakis, D. and Varda, M. and Papadopoulou, E.L. and Kayambaki, M. and Tsagaraki, K. and Kambilafka, V. and Modreanu, M. and Huyberechts, G. and Aperathitis, E. (2010) Properties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures. : .
2009Solar Energy Materials and Solar CellsOptical spectroscopy study of nc-Si-based p-i-n solar cells
Sancho-Parramon, J. and Gracin, D. and Modreanu, M. and Gajović, A. (2009) Optical spectroscopy study of nc-Si-based p-i-n solar cells. : .
2009Thin Solid FilmsProperties of n-type ZnN thin films as channel for transparent thin film transistors
Aperathitis, E. and Kambilafka, V. and Modreanu, M. (2009) Properties of n-type ZnN thin films as channel for transparent thin film transistors. : .
2009ACS Applied Materials and InterfacesEffect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices
Himmerlich, M. and Koufaki, M. and Ecke, G. and Mauder, C. and Cimalla, V. and Schaefer, J.A. and Kondilis, A. and Pelekanos, N.T. and Modreanu, M. and Krischok, S. and Aperathitis, E. (2009) Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices. : .
2008Physica Status Solidi (A) Applications and Materials ScienceStudy of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD
Deschanvres, J.L. and Millon, C. and Jimenez, C. and Khan, A. and Roussel, H. and Servet, B. and Durand, O. and Modreanu, M. (2008) Study of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD. : .
2008Physica Status Solidi (A) Applications and Materials ScienceElectrical properties of chlorine-doped ZnO thin films grown by MOCVD
Chikoidze, E. and Modreanu, M. and Sallet, V. and Gorochov, O. and Galtier, P. (2008) Electrical properties of chlorine-doped ZnO thin films grown by MOCVD. : .
2008Thin Solid FilmsGrowth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD
Deschanvres, J.L. and Jimenez, C. and Rapenne, L. and McSporran, N. and Servet, B. and Durand, O. and Modreanu, M. (2008) Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD. : .
2008Thin Solid FilmsEffect of chlorine doping on electrical and optical properties of ZnO thin films
Chikoidze, E. and Nolan, M. and Modreanu, M. and Sallet, V. and Galtier, P. (2008) Effect of chlorine doping on electrical and optical properties of ZnO thin films. : .
2008Thin Solid FilmsOptical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion
Sancho-Parramon, J. and Modreanu, M. and Bosch, S. and Stchakovsky, M. (2008) Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion. : .
2008Journal of Applied PhysicsElectrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation
Cherkaoui, K. and Monaghan, S. and Negara, M.A. and Modreanu, M. and Hurley, P.K. and O'Connell, D. and McDonnell, S. and Hughes, G. and Wright, S. and Barklie, R.C. and Bailey, P. and Noakes, T.C.Q. (2008) Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation. : .
2008Thin Solid FilmsDerivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements
Kondilis, A. and Aperathitis, E. and Modreanu, M. (2008) Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements. : .
2007Thin Solid FilmsExtraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra
Kondilis, A. and Aperathitis, E. and Modreanu, M. (2007) Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra. : .
2007Thin Solid FilmsOptical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies
Modreanu, M. and Nolan, M. and Elliott, S.D. and Durand, O. and Servet, B. and Garry, G. and Gehan, H. and Huyberechts, G. and Papadopoulou, E.L. and Androulidaki, M. and Aperathitis, E. (2007) Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies. : .
2007Surface and Coatings TechnologyStudy of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films
Millon, C. and Deschanvres, J.L. and Jiménez, C. and Macsporran, N. and Servet, B. and Durand, O. and Modreanu, M. (2007) Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films. : .
2007Thin Solid FilmsStudies of oxide-based thin-layered heterostructures by X-ray scattering methods
Durand, O. and Rogers, D. and Teherani, F.H. and Andrieux, M. and Modreanu, M. (2007) Studies of oxide-based thin-layered heterostructures by X-ray scattering methods. : .
2007Thin Solid FilmsOptical and microstructural properties of p-type SrCu< sub> 2 O< sub> 2: First principles modeling and experimental studies
Modreanu, M and Nolan, M and Elliott, SD and Durand, O and Servet, B and Garry, G and Gehan, H and Huyberechts, G and Papadopoulou, EL and Androulidaki, M and others (2007) Optical and microstructural properties of p-type SrCu< sub> 2 O< sub> 2: First principles modeling and experimental studies. : .
2006Applied Surface ScienceInvestigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films
Modreanu, M. and Sancho-Parramon, J. and Durand, O. and Servet, B. and Stchakovsky, M. and Eypert, C. and Naudin, C. and Knowles, A. and Bridou, F. and Ravet, M.-F. (2006) Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films. : .
2006Applied Surface ScienceOptical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering
Ianculescu, A. and Gartner, M. and Despax, B. and Bley, V. and Lebey, Th. and Gavrilǎ, R. and Modreanu, M. (2006) Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering. : .
2006Applied Surface ScienceOptical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering
Koufaki, M. and Sifakis, M. and Iliopoulos, E. and Pelekanos, N. and Modreanu, M. and Cimalla, V. and Ecke, G. and Aperathitis, E. (2006) Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering. : .
2006Applied Surface ScienceStabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings
Trapalis, C. and Gartner, M. and Modreanu, M. and Kordas, G. and Anastasescu, M. and Scurtu, R. and Zaharescu, M. (2006) Stabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings. : .
2006Applied Surface ScienceThin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform
Bridou, F. and Gautier, J. and Delmotte, F. and Ravet, M.-F. and Durand, O. and Modreanu, M. (2006) Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform. : .
2006Semiconductor science and technologyCharacterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
Ginige, R and Corbett, B and Modreanu, M and Barrett, C and Hilgarth, J and Isella, G and Chrastina, D and von K"anel, H (2006) Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells. : .
2006Applied Surface ScienceOptical characterization of InxGa1-xN alloys
Gartner, M. and Kruse, C. and Modreanu, M. and Tausendfreund, A. and Roder, C. and Hommel, D. (2006) Optical characterization of InxGa1-xN alloys. : .
2006Semiconductor Science and TechnologyCharacterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
Ginige, R. and Corbett, B. and Modreanu, M. and Barrett, C. and Hilgarth, J. and Isella, G. and Chrastina, D. and Von Känel, H. (2006) Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells. : .
2005Microelectronics ReliabilityElectrical characterization of HfO2 films obtained by UV assisted injection MOCVD
Decams, J.M. and Guillon, H. and Jiménez, C. and Audier, M. and Sénateur, J.P. and Dubourdieu, C. and Cadix, O. and O'Sullivan, B.J. and Modreanu, M. and Hurley, P.K. and Rusworth, S. and Leedham, T.J. and Davies, H. and Fang, Q. and Boyd, I. (2005) Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. : .
2005Microelectronics ReliabilityLPCVD-silicon oxynitride films: Interface properties
Halova, E. and Alexandrova, S. and Szekeres, A. and Modreanu, M. (2005) LPCVD-silicon oxynitride films: Interface properties. : .
2005Microelectronics ReliabilityPost deposition UV-induced O2 annealing of HfO2 thin films
Fang, Q. and Liaw, I. and Modreanu, M. and Hurley, P.K. and Boyd, I.W. (2005) Post deposition UV-induced O2 annealing of HfO2 thin films. : .
2005Materials Science and Engineering B: Solid-State Materials for Advanced TechnologySolid phase crystallisation of HfO2 thin films
Modreanu, M. and Sancho-Parramon, J. and O'Connell, D. and Justice, J. and Durand, O. and Servet, B. (2005) Solid phase crystallisation of HfO2 thin films. : .
2005Optical MaterialsCharacterisation of room temperature blue emmiting Si/SiO2 multilayers
Modreanu, M. and Aperathitis, E. and Androulidaki, M. and Audier, M. and Chaix-Pluchery, O. (2005) Characterisation of room temperature blue emmiting Si/SiO2 multilayers. : .
2005Journal of Optoelectronics and Advanced MaterialsThe influence of Cu on the morphological and chemical properties of nanostructured TiO2 films
Gartner, M. and Ghita, A. and Anastasescu, M. and Osiceanu, P. and Dobrescu, G. and Zaharescu, M. and Macovei, D. and Modreanu, M. and Trapalis, C. and Kordas, G. (2005) The influence of Cu on the morphological and chemical properties of nanostructured TiO2 films. : .
2004Thin Solid FilmsPhotoreflectance spectroscopy study of vertical cavity surface emitting laser structures
Murtagh, M.E. and Guenebaut, V. and Ward, S. and Nee, D. and Kelly, P.V. and O'Looney, B. and Murphy, F. and Modreanu, M. and Westwater, S. and Blunt, R. and Bland, S.W. (2004) Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures. : .
2004Thin Solid FilmsThin Soild Films: Editorial
Modreanu, M. and Murtagh, M. and Ricote, J. and Chateigner, D. and Schreiber, J. (2004) Thin Soild Films: Editorial. : .
2004Thin Solid FilmsOptical properties of silicon thin films related to LPCVD growth condition
Modreanu, M. and Gartner, M. and Cobianu, C. and O'Looney, B. and Murphy, F. (2004) Optical properties of silicon thin films related to LPCVD growth condition. : .
2004Thin Solid FilmsX-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-κ materials
Ferrari, S. and Modreanu, M. and Scarel, G. and Fanciulli, M. (2004) X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-κ materials. : .
2004Thin Solid FilmsInterface of ultrathin HfO2 films deposited by UV-photo-CVD
Fang, Q. and Zhang, J.-Y. and Wang, Z. and Modreanu, M. and O'Sullivan, B.J. and Hurley, P.K. and Leedham, T.L. and Hywel, D. and Audier, M.A. and Jimenez, C. and Senateur, J.-P. and Boyd, I.W. (2004) Interface of ultrathin HfO2 films deposited by UV-photo-CVD. : .
2004Thin Solid FilmsSpectroellipsometric characterization of sol-gel TiO2-CuO thin coatings
Gartner, M. and Scurtu, R. and Ghita, A. and Zaharescu, M. and Modreanu, M. and Trapalis, C. and Kokkoris, M. and Kordas, G. (2004) Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings. : .
2004Thin Solid FilmsOptical characterization of indium-tin-oxynitride fabricated by RF-sputtering
Aperathitis, E. and Modreanu, M. and Bender, M. and Cimalla, V. and Ecke, G. and Androulidaki, M. and Pelekanos, N. (2004) Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering. : .
2003Physica E: Low-Dimensional Systems and NanostructuresInvestigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices
Modreanu, M. and Gartner, M. and Aperathitis, E. and Tomozeiu, N. and Androulidaki, M. and Cristea, D. and Hurley, P. (2003) Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices. : .
2003Journal of Applied PhysicsProperties of rf-sputtered indium-tin-oxynitride thin films
Aperathitis, E. and Bender, M. and Cimalla, V. and Ecke, G. and Modreanu, M. (2003) Properties of rf-sputtered indium-tin-oxynitride thin films. : .
2003Materials Science and Engineering B: Solid-State Materials for Advanced TechnologySilicon micromachined sensor for gas detection
Moldovan, C. and Hinescu, L. and Hinescu, M. and Iosub, R. and Nisulescu, M. and Firtat, B. and Modreanu, M. and Dascalu, D. and Voicu, V. and Tarabasanu, C. (2003) Silicon micromachined sensor for gas detection. : .
2002Sensors and Actuators, A: PhysicalSilicon membranes fabrication by wet anisotropic etching
Iosub, R. and Moldovan, C. and Modreanu, M. (2002) Silicon membranes fabrication by wet anisotropic etching. : .
2002Sensors and Actuators, A: PhysicalThe etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures
Modreanu, M. and Moldovan, C. and Iosub, R. (2002) The etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures. : .
2002Sensors and Actuators, A: PhysicalMicromachining of a silicon multichannel microprobe for neural electrical activity recording
Moldovan, C. and Ilian, V. and Constantin, Ghe. and Iosub, R. and Modreanu, M. and Dinoiu, I. and Firtat, B. and Voitincu, C. (2002) Micromachining of a silicon multichannel microprobe for neural electrical activity recording. : .
2002Sensors and Actuators, A: PhysicalMicrostructural information from optical properties of LPCVD silicon films annealed at low temperature
Gartner, M. and Modreanu, M. and Cobianu, C. and Gavrila, R. and Danila, M. (2002) Microstructural information from optical properties of LPCVD silicon films annealed at low temperature. : .
2002Surface ScienceOn the structure, morphology and electrical conductivities of titanium oxide thin films
Mardare, D. and Baban, C. and Gavrila, R. and Modreanu, M. and Rusu, G.I. (2002) On the structure, morphology and electrical conductivities of titanium oxide thin films. : .
2002User Modeling and User-Adapted InteractionLPCVD-silicon oxynitride films: Low-temperature annealing effects
Alexandrova, S. and Szekeres, A. and Halova, E. and Modreanu, M. (2002) LPCVD-silicon oxynitride films: Low-temperature annealing effects. : .
2002Materials Science and Engineering CInvestigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices
Modreanu, M. and Gartner, M. and Cristea, D. (2002) Investigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices. : .
2001International Journal of Inorganic MaterialsElimination of silicon hillocks using an alkaline complexant etching system
Moldovan, C. and Iosub, R. and Modreanu, M. (2001) Elimination of silicon hillocks using an alkaline complexant etching system. : .
2001Physica Status Solidi (A) Applied ResearchCapacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films
Szekeres, A. and Alexandrova, S. and Modreanu, M. (2001) Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films. : .
2001Optical MaterialsPhotonic circuits integrated with CMOS compatible photodetectors
Cristea, D. and Craciunoiu, F. and Modreanu, M. and Caldararu, M. and Cernica, I. (2001) Photonic circuits integrated with CMOS compatible photodetectors. : .
2001Optical MaterialsInvestigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films
Modreanu, M. and Gartner, M. and Tomozeiu, N. and Seekamp, J. and Cosmin, P. (2001) Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films. : .
2001Journal of Molecular StructureInvestigation on optical properties of CVD films used in MOEMS applications
Modreanu, M. and Gartner, M. (2001) Investigation on optical properties of CVD films used in MOEMS applications. : .
2001Thin Solid FilmsMicrostructural and optical properties of as-deposited LPCVD silicon films
Modreanu, M. and Tomozeiu, N. and Gartner, M. and Cosmin, P. (2001) Microstructural and optical properties of as-deposited LPCVD silicon films. : .
2001VacuumOptical and electrical properties of LPCVD silicon oxynitride films on silicon
Szekeres, A. and Alexandrova, S. and Modreanu, M. and Cosmin, P. and Gartner, M. (2001) Optical and electrical properties of LPCVD silicon oxynitride films on silicon. : .
2001Thin Solid FilmsPhysical properties of polycrystalline silicon films related to LPCVD conditions
Modreanu, M. and Bercu, M. and Cobianu, C. (2001) Physical properties of polycrystalline silicon films related to LPCVD conditions. : .
1999Microelectronics ReliabilityOptical characterization of dielectric borophosphosilicate glass
Gartner, M. and Modreanu, M. and Bosch, S. and Stoica, T. (1999) Optical characterization of dielectric borophosphosilicate glass. : .
1999Thin Solid FilmsOptical properties of LPCVD silicon oxynitride
Modreanu, M. and Tomozeiu, N. and Cosmin, P. and Gartner, M. (1999) Optical properties of LPCVD silicon oxynitride. : .

Editorship

YearPublication
2013Special issue on "Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012-Symposium W, held in Strasbourg, France, May 14-18, 2012
Modreanu, M,Durand, O,Jellison, GE,Salviati, G,Fried, M (2013) Special issue on "Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012-Symposium W, held in Strasbourg, France, May 14-18, 2012. : . [Details]

Honours and Awards

  • [2011] - Best Paper Award

Professional Associations

  • [2012] Board Member

Employment

  • [1993] National Institute for Microtechnologies, IMT-Bucharest, Romania - Senior Researcher

Education

  • [1993] University of Bucharest, Romania - MASTERS IN PHYSICS
  • [2002] University of Bucharest, Romania - Ph.D.

Languages

  • Romanian
  • English
  • French

Journal Activities

  • Thin Solid Films - Guest Editor
  • Applied Physics Letters - Referee
  • Analyst - Referee
  • Physical Chemistry Chemical Physics - Referee
  • ChemPhysChem - Referee
  • Appl Surf Sci - Referee
  • Phys Status Solidi-R - Referee
  • Journal of Physics D: Applied Physics - Referee
  • CrystEngComm - Referee
  • Opt Mater - Referee
  • Energy & Environmental Science - Referee
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struct
biography <b>EDUCATION:</b> 1993 - Master of Science degree in Atomic and Molecular Physics from Faculty of Physics, University of Bucharest. 2001 –Ph.D.degree in Condensed Physics Matter (Magna cum Laude), from University of Bucharest. The thesis is dedicated to the theoretical and experimental study of deposition kinetics, optical,electrical and structural properties of amorphous and crystalline silicon, silicon nitride, silicon oxynitride and silicon-rich nitride and doped and undoped SiO2 CVD thin films. <b>&nbsp;</b> <b>POSITIONS HELD&nbsp; : </b> <span>2006-&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; <b>Tyndall National Institute</b> , Cork, Ireland, Staff Research Scientist, Optical Spectroscopy Laboratory&nbsp; Manager</span> <span>2002-2006&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; <b>National Microelectronics Research Centre, </b>Cork, Ireland, Post Doctoral Fellow</span> <span>1999<i>-</i>2001<i>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; </i><b>National Institute for R&amp;D for Microtechnologies</b>, Bucharest, Romania:<i> Senior Researcher</i>: research, development and characterization of CVD thin films for semiconductors and MOEMS technologies </span> <span>1995- 1999&nbsp;&nbsp;&nbsp; <b>National Institute for R&amp;D for Microtechnologies</b>, Bucharest, Romania:</span> <span><i>Process Engineer: </i>APCVD&amp;LPCVD process sustaining and development for MOS and microsensors technologies</span> <span>1993- 1995&nbsp;&nbsp;&nbsp; <b>National Institute for R&amp;D for Microtechnologies</b>, Bucharest, Romania:</span> <span><i>Process Engineer: </i>APCVD process sustaining and development for MOS technologies.</span> <b>EXPERIENCE :</b>&nbsp;<i>Dr. Mircea Modreanu has obtained a Ph.D. in Condensed Matter Physics in 2002 from the University of Bucharest, Romania. He has received Research Professor Fellowships from PHELMA-INPG Grenoble, France (2013-2014) and recently (2019) from the Japan Society for Promotion of Science (JSPS).&nbsp;&nbsp;</i><div><i>Dr. Mircea Modreanu joined Tyndall National Institute-University College Cork Ireland in 2002 where he is Principal Investigator working in several EU-funded research projects.&nbsp;&nbsp;</i></div><div><i>Dr. Mircea Modreanu currently is Project Coordinator for the H2020 EIC FET Proactive project Nanomaterials enabling smart energy harvesting for next-generation Internet-of-Things (NANO-EH, Grant No 951761, 2020-2023) and also Principal Investigator in two other EU H2020 projects, namely FET Open PHEMTRONICS (2020-2023) and ICT NANOSMART (2019-2022).</i></div><div><i>Dr. Mircea Modreanu has over 25 years of track record in material science (with a particular focus on oxide materials), in developing novel materials for microelectronics and optoelectronics application, and in optical spectroscopies for thin films and interfaces. He has established expertise within the area of optical spectroscopies (spectroscopic ellipsometry, optical spectrophotometry, and Raman and IR spectroscopies) for the studies of thin films and their interfaces. He has extensively researched the growth of HfO2 and ferroelectric HfZrO by several growth techniques ( e.g. E-beam, MOCVD, and ALD) for future CMOS technologies. He has also explored other metal oxides for microelectronics and optoelectronics applications (e.g. ZrO2, La2O6, Lu2O6, Ta2O5, Ba-doped SrCu2O2, Sr-doped Cu2O, ZnO, TiO2, BaCu2O2 and Gd2O3) and as well emerging two-dimensional materials such as graphene, MoS2, HfS2, and PtS2. In a recently funded H2020 FET Open project, PHEMTRONICS Dr. Mircea Modreanu's research interest was extended to novel phase-change materials such as GaS, GeS and Sb2S3 for ultrafast optoelectronic applications.</i></div><div><i>Dr. Mircea Modrean
contact-details
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address1 TYNDALL MICRONANO ELECTRONICS
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professional-activities
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activity-date 01-JAN-93
description University of Bucharest, Romania - MASTERS IN PHYSICS
type EDUCATION
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description University of Bucharest, Romania - Ph.D.
type EDUCATION
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description Romanian
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activity-date 14-MAY-12
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activity-date 01-SEP-93
description National Institute for Microtechnologies, IMT-Bucharest, Romania - Senior Researcher
type EMPLOYMENT
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activity-date 01-JAN-11
description - Best Paper Award
type AWARD
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10
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description Applied Physics Letters - Referee
type REVIEW
year [empty string]
11
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type REVIEW
year [empty string]
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activity-date [empty string]
description Physical Chemistry Chemical Physics - Referee
type REVIEW
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description Phys Status Solidi-R - Referee
type REVIEW
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activity-date [empty string]
description Journal of Physics D: Applied Physics - Referee
type REVIEW
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activity-date [empty string]
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type REVIEW
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activity-date [empty string]
description Opt Mater - Referee
type REVIEW
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activity-date [empty string]
description Energy & Environmental Science - Referee
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publications
array
1
struct
authors Gartner, M. and Stroescu, H. and Marin, A. and Osiceanu, P. and Anastasescu, M. and Stoica, M. and Nicolescu, M. and Duta, M. and Preda, S. and Aperathitis, E. and Pantazis, A. and Kampylafka, V. and Modreanu, M. and Zaharescu, M.
doi [empty string]
id 276586798
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films
type Other Journal
year 2014
2
struct
authors Ormsby, R.W. and Modreanu, M. and Mitchell, C.A. and Dunne, N.J.
doi [empty string]
id 276586800
journal Journal of Biomaterials Applications
other_type [empty string]
publisher [empty string]
title Carboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications
type Other Journal
year 2014
3
struct
authors Rossi, F. and Fabbri, F. and Tallarida, M. and Schmeisser, D. and Modreanu, M. and Attolini, G. and Salviati, G.
doi [empty string]
id 276586802
journal Scripta Materialia
other_type [empty string]
publisher [empty string]
title Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires
type Other Journal
year 2013
4
struct
authors Stroescu, H. and Anastasescu, M. and Preda, S. and Nicolescu, M. and Stoica, M. and Stefan, N. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. and Zaharescu, M. and Gartner, M.
doi [empty string]
id 276586803
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films
type Other Journal
year 2013
5
struct
authors Rey, G. and Ternon, C. and Modreanu, M. and Mescot, X. and Consonni, V. and Bellet, D.
doi [empty string]
id 276586801
journal Journal of Applied Physics
other_type [empty string]
publisher [empty string]
title Electron scattering mechanisms in fluorine-doped SnO2 thin films
type Other Journal
year 2013
6
struct
authors Modreanu, M,Durand, O,Jellison, GE,Salviati, G,Fried, M
doi 10.1016/j.tsf.2013.07.027
id 243939649
journal Thin Solid Films
other_type Editorship
publisher [empty string]
title Special issue on "Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012-Symposium W, held in Strasbourg, France, May 14-18, 2012
type More Publications
year 2013
7
struct
authors Even, J. and Pedesseau, L. and Durand, O. and Modreanu, M. and Huyberechts, G. and Servet, B. and Chaix-Pluchery, O.
doi [empty string]
id 276586804
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Vibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements
type Other Journal
year 2013
8
struct
authors Modreanu, M. and Durand, O. and Jellison, G.E. and Salviati, G. and Fried, M.
doi [empty string]
id 276586805
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Special issue on "current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III", E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012
type Other Journal
year 2013
9
struct
authors Murad, S.N.A. and Baine, P.T. and McNeill, D.W. and Mitchell, S.J.N. and Armstrong, B.M. and Modreanu, M. and Hughes, G. and Chellappan, R.K.
doi [empty string]
id 276586809
journal Solid-State Electronics
other_type [empty string]
publisher [empty string]
title Optimisation and scaling of interfacial GeO 2 layers for high-κ gate stacks on germanium and extraction of dielectric constant of GeO 2
type Other Journal
year 2012
10
struct
authors Nicolescu, M. and Anastasescu, M. and Preda, S. and Stroescu, H. and Stoica, M. and Teodorescu, V.S. and Aperathitis, E. and Kampylafka, V. and Modreanu, M. and Zaharescu, M. and Gartner, M.
doi [empty string]
id 276586811
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Influence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing
type Other Journal
year 2012
11
struct
authors Kambilafka, V. and Kostopoulos, A. and Androulidaki, M. and Tsagaraki, K. and Modreanu, M. and Aperathitis, E.
doi [empty string]
id 276586813
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Transparent p/n diode device from a single zinc nitride sputtering target
type Other Journal
year 2011
12
struct
authors McManus, L.L. and Burke, G.A. and McCafferty, M.M. and O'Hare, P. and Modreanu, M. and Boyd, A.R. and Meenan, B.J.
doi [empty string]
id 276586816
journal Analyst
other_type [empty string]
publisher [empty string]
title Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells
type Other Journal
year 2011
13
struct
authors Modreanu, M and Monaghan, S and Povey, IM and Cherkaoui, K and Hurley, PK and Androulidaki, M
doi [empty string]
id 281444130
journal Microelectronic Engineering
other_type [empty string]
publisher [empty string]
title Investigation of bulk defects in amorphous and crystalline HfO< sub> 2</sub> thin films
type Other Journal
year 2011
14
struct
authors Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Osiceanu, P. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M.
doi [empty string]
id 276586819
journal Journal of Optoelectronics and Advanced Materials
other_type [empty string]
publisher [empty string]
title Investigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate
type Other Journal
year 2010
15
struct
authors Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Stroescu, H. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M.
doi [empty string]
id 276586818
journal Journal of Optoelectronics and Advanced Materials
other_type [empty string]
publisher [empty string]
title Surface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates
type Other Journal
year 2010
16
struct
authors Louloudakis, D. and Varda, M. and Papadopoulou, E.L. and Kayambaki, M. and Tsagaraki, K. and Kambilafka, V. and Modreanu, M. and Huyberechts, G. and Aperathitis, E.
doi [empty string]
id 276586817
journal Physica Status Solidi (A) Applications and Materials Science
other_type [empty string]
publisher [empty string]
title Properties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures
type Other Journal
year 2010
17
struct
authors Sancho-Parramon, J. and Gracin, D. and Modreanu, M. and Gajović, A.
doi [empty string]
id 276586821
journal Solar Energy Materials and Solar Cells
other_type [empty string]
publisher [empty string]
title Optical spectroscopy study of nc-Si-based p-i-n solar cells
type Other Journal
year 2009
18
struct
authors Aperathitis, E. and Kambilafka, V. and Modreanu, M.
doi [empty string]
id 276586820
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Properties of n-type ZnN thin films as channel for transparent thin film transistors
type Other Journal
year 2009
19
struct
authors Himmerlich, M. and Koufaki, M. and Ecke, G. and Mauder, C. and Cimalla, V. and Schaefer, J.A. and Kondilis, A. and Pelekanos, N.T. and Modreanu, M. and Krischok, S. and Aperathitis, E.
doi [empty string]
id 276586822
journal ACS Applied Materials and Interfaces
other_type [empty string]
publisher [empty string]
title Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices
type Other Journal
year 2009
20
struct
authors Deschanvres, J.L. and Millon, C. and Jimenez, C. and Khan, A. and Roussel, H. and Servet, B. and Durand, O. and Modreanu, M.
doi [empty string]
id 276586827
journal Physica Status Solidi (A) Applications and Materials Science
other_type [empty string]
publisher [empty string]
title Study of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD
type Other Journal
year 2008
21
struct
authors Chikoidze, E. and Modreanu, M. and Sallet, V. and Gorochov, O. and Galtier, P.
doi [empty string]
id 276586828
journal Physica Status Solidi (A) Applications and Materials Science
other_type [empty string]
publisher [empty string]
title Electrical properties of chlorine-doped ZnO thin films grown by MOCVD
type Other Journal
year 2008
22
struct
authors Deschanvres, J.L. and Jimenez, C. and Rapenne, L. and McSporran, N. and Servet, B. and Durand, O. and Modreanu, M.
doi [empty string]
id 276586829
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD
type Other Journal
year 2008
23
struct
authors Chikoidze, E. and Nolan, M. and Modreanu, M. and Sallet, V. and Galtier, P.
doi [empty string]
id 276586826
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Effect of chlorine doping on electrical and optical properties of ZnO thin films
type Other Journal
year 2008
24
struct
authors Sancho-Parramon, J. and Modreanu, M. and Bosch, S. and Stchakovsky, M.
doi [empty string]
id 276586824
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion
type Other Journal
year 2008
25
struct
authors Cherkaoui, K. and Monaghan, S. and Negara, M.A. and Modreanu, M. and Hurley, P.K. and O'Connell, D. and McDonnell, S. and Hughes, G. and Wright, S. and Barklie, R.C. and Bailey, P. and Noakes, T.C.Q.
doi [empty string]
id 276586823
journal Journal of Applied Physics
other_type [empty string]
publisher [empty string]
title Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation
type Other Journal
year 2008
26
struct
authors Kondilis, A. and Aperathitis, E. and Modreanu, M.
doi [empty string]
id 276586825
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements
type Other Journal
year 2008
27
struct
authors Kondilis, A. and Aperathitis, E. and Modreanu, M.
doi [empty string]
id 276586831
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra
type Other Journal
year 2007
28
struct
authors Modreanu, M. and Nolan, M. and Elliott, S.D. and Durand, O. and Servet, B. and Garry, G. and Gehan, H. and Huyberechts, G. and Papadopoulou, E.L. and Androulidaki, M. and Aperathitis, E.
doi [empty string]
id 276586832
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies
type Other Journal
year 2007
29
struct
authors Millon, C. and Deschanvres, J.L. and Jiménez, C. and Macsporran, N. and Servet, B. and Durand, O. and Modreanu, M.
doi [empty string]
id 276586833
journal Surface and Coatings Technology
other_type [empty string]
publisher [empty string]
title Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films
type Other Journal
year 2007
30
struct
authors Durand, O. and Rogers, D. and Teherani, F.H. and Andrieux, M. and Modreanu, M.
doi [empty string]
id 276586834
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Studies of oxide-based thin-layered heterostructures by X-ray scattering methods
type Other Journal
year 2007
31
struct
authors Modreanu, M and Nolan, M and Elliott, SD and Durand, O and Servet, B and Garry, G and Gehan, H and Huyberechts, G and Papadopoulou, EL and Androulidaki, M and others
doi [empty string]
id 283617524
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Optical and microstructural properties of p-type SrCu< sub> 2</sub> O< sub> 2</sub>: First principles modeling and experimental studies
type Other Journal
year 2007
32
struct
authors Modreanu, M. and Sancho-Parramon, J. and Durand, O. and Servet, B. and Stchakovsky, M. and Eypert, C. and Naudin, C. and Knowles, A. and Bridou, F. and Ravet, M.-F.
doi [empty string]
id 276586840
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films
type Other Journal
year 2006
33
struct
authors Ianculescu, A. and Gartner, M. and Despax, B. and Bley, V. and Lebey, Th. and Gavrilǎ, R. and Modreanu, M.
doi [empty string]
id 276586839
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering
type Other Journal
year 2006
34
struct
authors Koufaki, M. and Sifakis, M. and Iliopoulos, E. and Pelekanos, N. and Modreanu, M. and Cimalla, V. and Ecke, G. and Aperathitis, E.
doi [empty string]
id 276586838
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering
type Other Journal
year 2006
35
struct
authors Trapalis, C. and Gartner, M. and Modreanu, M. and Kordas, G. and Anastasescu, M. and Scurtu, R. and Zaharescu, M.
doi [empty string]
id 276586837
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Stabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings
type Other Journal
year 2006
36
struct
authors Bridou, F. and Gautier, J. and Delmotte, F. and Ravet, M.-F. and Durand, O. and Modreanu, M.
doi [empty string]
id 276586836
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform
type Other Journal
year 2006
37
struct
authors Ginige, R and Corbett, B and Modreanu, M and Barrett, C and Hilgarth, J and Isella, G and Chrastina, D and von K"anel, H
doi [empty string]
id 271098843
journal Semiconductor science and technology
other_type [empty string]
publisher [empty string]
title Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
type Other Journal
year 2006
38
struct
authors Gartner, M. and Kruse, C. and Modreanu, M. and Tausendfreund, A. and Roder, C. and Hommel, D.
doi [empty string]
id 276586841
journal Applied Surface Science
other_type [empty string]
publisher [empty string]
title Optical characterization of InxGa1-xN alloys
type Other Journal
year 2006
39
struct
authors Ginige, R. and Corbett, B. and Modreanu, M. and Barrett, C. and Hilgarth, J. and Isella, G. and Chrastina, D. and Von Känel, H.
doi [empty string]
id 276586842
journal Semiconductor Science and Technology
other_type [empty string]
publisher [empty string]
title Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
type Other Journal
year 2006
40
struct
authors Decams, J.M. and Guillon, H. and Jiménez, C. and Audier, M. and Sénateur, J.P. and Dubourdieu, C. and Cadix, O. and O'Sullivan, B.J. and Modreanu, M. and Hurley, P.K. and Rusworth, S. and Leedham, T.J. and Davies, H. and Fang, Q. and Boyd, I.
doi [empty string]
id 276586844
journal Microelectronics Reliability
other_type [empty string]
publisher [empty string]
title Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD
type Other Journal
year 2005
41
struct
authors Halova, E. and Alexandrova, S. and Szekeres, A. and Modreanu, M.
doi [empty string]
id 276586845
journal Microelectronics Reliability
other_type [empty string]
publisher [empty string]
title LPCVD-silicon oxynitride films: Interface properties
type Other Journal
year 2005
42
struct
authors Fang, Q. and Liaw, I. and Modreanu, M. and Hurley, P.K. and Boyd, I.W.
doi [empty string]
id 276586846
journal Microelectronics Reliability
other_type [empty string]
publisher [empty string]
title Post deposition UV-induced O2 annealing of HfO2 thin films
type Other Journal
year 2005
43
struct
authors Modreanu, M. and Sancho-Parramon, J. and O'Connell, D. and Justice, J. and Durand, O. and Servet, B.
doi [empty string]
id 276586847
journal Materials Science and Engineering B: Solid-State Materials for Advanced Technology
other_type [empty string]
publisher [empty string]
title Solid phase crystallisation of HfO2 thin films
type Other Journal
year 2005
44
struct
authors Modreanu, M. and Aperathitis, E. and Androulidaki, M. and Audier, M. and Chaix-Pluchery, O.
doi [empty string]
id 276586848
journal Optical Materials
other_type [empty string]
publisher [empty string]
title Characterisation of room temperature blue emmiting Si/SiO2 multilayers
type Other Journal
year 2005
45
struct
authors Gartner, M. and Ghita, A. and Anastasescu, M. and Osiceanu, P. and Dobrescu, G. and Zaharescu, M. and Macovei, D. and Modreanu, M. and Trapalis, C. and Kordas, G.
doi [empty string]
id 276586849
journal Journal of Optoelectronics and Advanced Materials
other_type [empty string]
publisher [empty string]
title The influence of Cu on the morphological and chemical properties of nanostructured TiO2 films
type Other Journal
year 2005
46
struct
authors Murtagh, M.E. and Guenebaut, V. and Ward, S. and Nee, D. and Kelly, P.V. and O'Looney, B. and Murphy, F. and Modreanu, M. and Westwater, S. and Blunt, R. and Bland, S.W.
doi [empty string]
id 276586857
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures
type Other Journal
year 2004
47
struct
authors Modreanu, M. and Murtagh, M. and Ricote, J. and Chateigner, D. and Schreiber, J.
doi [empty string]
id 276586856
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Thin Soild Films: Editorial
type Other Journal
year 2004
48
struct
authors Modreanu, M. and Gartner, M. and Cobianu, C. and O'Looney, B. and Murphy, F.
doi [empty string]
id 276586855
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Optical properties of silicon thin films related to LPCVD growth condition
type Other Journal
year 2004
49
struct
authors Ferrari, S. and Modreanu, M. and Scarel, G. and Fanciulli, M.
doi [empty string]
id 276586854
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-κ materials
type Other Journal
year 2004
50
struct
authors Fang, Q. and Zhang, J.-Y. and Wang, Z. and Modreanu, M. and O'Sullivan, B.J. and Hurley, P.K. and Leedham, T.L. and Hywel, D. and Audier, M.A. and Jimenez, C. and Senateur, J.-P. and Boyd, I.W.
doi [empty string]
id 276586853
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Interface of ultrathin HfO2 films deposited by UV-photo-CVD
type Other Journal
year 2004
51
struct
authors Gartner, M. and Scurtu, R. and Ghita, A. and Zaharescu, M. and Modreanu, M. and Trapalis, C. and Kokkoris, M. and Kordas, G.
doi [empty string]
id 276586852
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings
type Other Journal
year 2004
52
struct
authors Aperathitis, E. and Modreanu, M. and Bender, M. and Cimalla, V. and Ecke, G. and Androulidaki, M. and Pelekanos, N.
doi [empty string]
id 276586858
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering
type Other Journal
year 2004
53
struct
authors Modreanu, M. and Gartner, M. and Aperathitis, E. and Tomozeiu, N. and Androulidaki, M. and Cristea, D. and Hurley, P.
doi [empty string]
id 276586862
journal Physica E: Low-Dimensional Systems and Nanostructures
other_type [empty string]
publisher [empty string]
title Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices
type Other Journal
year 2003
54
struct
authors Aperathitis, E. and Bender, M. and Cimalla, V. and Ecke, G. and Modreanu, M.
doi [empty string]
id 276586861
journal Journal of Applied Physics
other_type [empty string]
publisher [empty string]
title Properties of rf-sputtered indium-tin-oxynitride thin films
type Other Journal
year 2003
55
struct
authors Moldovan, C. and Hinescu, L. and Hinescu, M. and Iosub, R. and Nisulescu, M. and Firtat, B. and Modreanu, M. and Dascalu, D. and Voicu, V. and Tarabasanu, C.
doi [empty string]
id 276586860
journal Materials Science and Engineering B: Solid-State Materials for Advanced Technology
other_type [empty string]
publisher [empty string]
title Silicon micromachined sensor for gas detection
type Other Journal
year 2003
56
struct
authors Iosub, R. and Moldovan, C. and Modreanu, M.
doi [empty string]
id 276586868
journal Sensors and Actuators, A: Physical
other_type [empty string]
publisher [empty string]
title Silicon membranes fabrication by wet anisotropic etching
type Other Journal
year 2002
57
struct
authors Modreanu, M. and Moldovan, C. and Iosub, R.
doi [empty string]
id 276586869
journal Sensors and Actuators, A: Physical
other_type [empty string]
publisher [empty string]
title The etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures
type Other Journal
year 2002
58
struct
authors Moldovan, C. and Ilian, V. and Constantin, Ghe. and Iosub, R. and Modreanu, M. and Dinoiu, I. and Firtat, B. and Voitincu, C.
doi [empty string]
id 276586870
journal Sensors and Actuators, A: Physical
other_type [empty string]
publisher [empty string]
title Micromachining of a silicon multichannel microprobe for neural electrical activity recording
type Other Journal
year 2002
59
struct
authors Gartner, M. and Modreanu, M. and Cobianu, C. and Gavrila, R. and Danila, M.
doi [empty string]
id 276586867
journal Sensors and Actuators, A: Physical
other_type [empty string]
publisher [empty string]
title Microstructural information from optical properties of LPCVD silicon films annealed at low temperature
type Other Journal
year 2002
60
struct
authors Mardare, D. and Baban, C. and Gavrila, R. and Modreanu, M. and Rusu, G.I.
doi [empty string]
id 276586866
journal Surface Science
other_type [empty string]
publisher [empty string]
title On the structure, morphology and electrical conductivities of titanium oxide thin films
type Other Journal
year 2002
61
struct
authors Alexandrova, S. and Szekeres, A. and Halova, E. and Modreanu, M.
doi [empty string]
id 276586863
journal User Modeling and User-Adapted Interaction
other_type [empty string]
publisher [empty string]
title LPCVD-silicon oxynitride films: Low-temperature annealing effects
type Other Journal
year 2002
62
struct
authors Modreanu, M. and Gartner, M. and Cristea, D.
doi [empty string]
id 276586871
journal Materials Science and Engineering C
other_type [empty string]
publisher [empty string]
title Investigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices
type Other Journal
year 2002
63
struct
authors Moldovan, C. and Iosub, R. and Modreanu, M.
doi [empty string]
id 276586872
journal International Journal of Inorganic Materials
other_type [empty string]
publisher [empty string]
title Elimination of silicon hillocks using an alkaline complexant etching system
type Other Journal
year 2001
64
struct
authors Szekeres, A. and Alexandrova, S. and Modreanu, M.
doi [empty string]
id 276586878
journal Physica Status Solidi (A) Applied Research
other_type [empty string]
publisher [empty string]
title Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films
type Other Journal
year 2001
65
struct
authors Cristea, D. and Craciunoiu, F. and Modreanu, M. and Caldararu, M. and Cernica, I.
doi [empty string]
id 276586879
journal Optical Materials
other_type [empty string]
publisher [empty string]
title Photonic circuits integrated with CMOS compatible photodetectors
type Other Journal
year 2001
66
struct
authors Modreanu, M. and Gartner, M. and Tomozeiu, N. and Seekamp, J. and Cosmin, P.
doi [empty string]
id 276586880
journal Optical Materials
other_type [empty string]
publisher [empty string]
title Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films
type Other Journal
year 2001
67
struct
authors Modreanu, M. and Gartner, M.
doi [empty string]
id 276586881
journal Journal of Molecular Structure
other_type [empty string]
publisher [empty string]
title Investigation on optical properties of CVD films used in MOEMS applications
type Other Journal
year 2001
68
struct
authors Modreanu, M. and Tomozeiu, N. and Gartner, M. and Cosmin, P.
doi [empty string]
id 276586884
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Microstructural and optical properties of as-deposited LPCVD silicon films
type Other Journal
year 2001
69
struct
authors Szekeres, A. and Alexandrova, S. and Modreanu, M. and Cosmin, P. and Gartner, M.
doi [empty string]
id 276586882
journal Vacuum
other_type [empty string]
publisher [empty string]
title Optical and electrical properties of LPCVD silicon oxynitride films on silicon
type Other Journal
year 2001
70
struct
authors Modreanu, M. and Bercu, M. and Cobianu, C.
doi [empty string]
id 276586883
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Physical properties of polycrystalline silicon films related to LPCVD conditions
type Other Journal
year 2001
71
struct
authors Gartner, M. and Modreanu, M. and Bosch, S. and Stoica, T.
doi [empty string]
id 276586891
journal Microelectronics Reliability
other_type [empty string]
publisher [empty string]
title Optical characterization of dielectric borophosphosilicate glass
type Other Journal
year 1999
72
struct
authors Modreanu, M. and Tomozeiu, N. and Cosmin, P. and Gartner, M.
doi [empty string]
id 276586893
journal Thin Solid Films
other_type [empty string]
publisher [empty string]
title Optical properties of LPCVD silicon oxynitride
type Other Journal
year 1999
research-collaborators
array
1
struct
company INSA Rennes
country FRANCE
description partner in several collaborative research projects; several joint research publication;
name Prof. Olivier Durand
role partner in collaborative research projects
theme Silicon photonics ; microelectronics
type E
2
struct
company Thales R&T
country FRANCE
description industrial partner in several EU funded projects
name Dr. Afshin Ziaei
role Industrial partner
theme Microelectronics; RF-MEMS
type E
3
struct
company Thales R&T
country FRANCE
description Industrial partner in several EU funded projects
name Dr. Guy Garry
role Industrial partner
theme Micro and nanoelectronics
type E
4
struct
company INPG-LMGP
country FRANCE
description Joint research projects and joint research publication
name Dr. Carmen Jimenez
role Academic collaborator
theme Development of novel material for micro and nanoelectronics
type E
5
struct
company Thales R&T
country FRANCE
description joint research projects and joint publications
name Dr. Bernard Servet
role Industrial partner
theme Optical metrology on nanomaterials
type E
6
struct
company Institul de Chimie Fizica I.G.Murgulescu al Academiei Romane
country ROMANIA
description Development of spectroscopic ellipsometry for novel materials
name Dr Mariuca Gartner
role Academic collaborator
theme Spectroscopic ellipsometry
type E
7
struct
company Oak Ridge National Laboratory
country U.S.A.
description Optical spectroscopy: spectroscopic ellipsometry
name Dr. G.E.Jellison
role Academic collaborator
theme Optical spectroscopy
type E
8
struct
company University of Versailles
country FRANCE
description Joint research projects and joint publication
name Prof. Yves Dumont
role Academic colaborator
theme Transparent electronics; ferroelectrics
type E
research-interests <p>Functional metal oxides:</p><p>-dielectrics (high k materials, tunable refractive index materials)</p><p>-semiconductors (n-type TCOs, p-type TCOs)</p><p>-metal oxides for gas sensing application</p><p>2D materials:</p><p>-graphene</p><p>-graphene oxide</p><p>-MoS2</p><p>-black phosphorus</p><p>Advanced optical spectroscopy of thin films and their interfaces:</p><p>-amorphous to crystalline phase transition</p><p>-interfacial properties</p><p>-optical properties ( UV down to Far IR spectral range)</p><p>-vibrational properties (IR and Raman)</p><p>-spectroscopic ellipsometry</p><p>-optical spectrophotometry</p><p>-surface and tip enhanced IR and Raman spectrocopy</p><p>&nbsp;Transparent electronics</p><p>Virtual substrates for novel&nbsp;optoelectronic devices and for high efficiency solar cells</p><p>Integration of III-V materials on Si</p>
research-projects
array
1
struct
award 290000
description FP7 EU project No FP7-ICT-2011-8
end_date 08-SEP-15
funder European Framework Programme Seven (FP7)
project_id [empty string]
role [empty string]
start_date 03-SEP-12
title Carbon Based Smart Systems For wireless applications.
surname MODREANU
teaching-external-students
array [empty]
teaching-highlights [empty string]
teaching-interests [empty string]
teaching-modules
array [empty]
teaching-students
array [empty]
title Dr.